Reversible Strain-Induced Electron–Hole Recombination in Silicon Nanowires Observed with Femtosecond Pump–Probe Microscopy

Nano Letters

DOI: 10.1021/nl5026166

Erik M. Grumstrup, Michelle M. Gabriel, Christopher W. Pinion, James K. Parker, James F. Cahoon and John M. Papanikolas

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