Origins and Characteristics of the Threshold Voltage Variability of Quasiballistic Single-Walled Carbon Nanotube Field-Effect Transistors

ACS Nano

DOI: 10.1021/nn506839p

Qing Cao, Shu-jen Han, Ashish V. Penumatcha, Martin M. Frank, George S. Tulevski, Jerry Tersoff and Wilfried E. Haensch

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