Defect States below the Conduction Band Edge of HfO2 Grown on InP by Atomic Layer Deposition

The Journal of Physical Chemistry C

DOI: 10.1021/jp511666m

Yu-Seon Kang, Dae-Kyoung Kim, Hang-Kyu Kang, Sangwan Cho, Sungho Choi, Hyoungsub Kim, Jung-Hye Seo, Jouhahn Lee and Mann-Ho Cho

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