Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films

The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.5b01672

M. Trapatseli, D. Carta, A. Regoutz, A. Khiat, A. Serb, I. Gupta and T. Prodromakis
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