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Tuesday, June 02, 2015
Synchrotron Radiation Soft X-ray Induced Reduction in Graphene Oxide Characterized by Time-Resolved Photoelectron Spectroscopy
The Journal of Physical Chemistry C
DOI: 10.1021/jp512055g
Chi-Yuan Lin, Cheng-En Cheng, Shuai Wang, Hung Wei Shiu, Lo Yueh Chang, Chia-Hao Chen, Tsung-Wu Lin, Chen-Shiung Chang and Forest Shih-Sen Chien
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