Carrier Mobility Enhancement of Tensile Strained Si and SiGe Nanowires via Surface Defect Engineering

Nano Letters

DOI: 10.1021/acs.nanolett.5b01634

J. W. Ma, W. J. Lee, J. M. Bae, K. S. Jeong, S. H. Oh, J. H. Kim, S.-H. Kim, J.-H. Seo, J.-P. Ahn, H. Kim and M.-H. Cho
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