Thursday, October 22, 2015

Probing individual point defects in graphene via near-field Raman scattering

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR04664E, Communication
Sandro Mignuzzi, Naresh Kumar, Barry Brennan, Ian Gilmore, David Richards, Andrew John Pollard, Debdulal Roy
The Raman scattering D-peak in graphene is spatially localised in close proximity to defects. Here, we demonstrate the capability of tip-enhanced Raman spectroscopy (TERS) to probe individual point defects, even...
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