Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR04809E, Paper
DOI: 10.1039/C5NR04809E, Paper
A. B. Papandrew, Q. Li, M. B. Okatan, S. Jesse, C. Hartnett, S. V. Kalinin, R. K. Vasudevan
Variable temperature band-excitation atomic force microscopy in conjunction with I-V spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO4 during proton exchange induced by a Pt-coated conductive scanning probe.
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Variable temperature band-excitation atomic force microscopy in conjunction with I-V spectroscopy was used to investigate the crystalline superionic proton conductor CsHSO4 during proton exchange induced by a Pt-coated conductive scanning probe.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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