Monday, March 14, 2016

When the Sequence of Thin Film Deposition Matters: Examination of Organic-on-Organic Heterostructure Formation Using Molecular Beam Techniques and in Situ Real Time X-ray Synchrotron Radiation

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The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b01717


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/1S01N2u
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