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Thursday, September 15, 2016
Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering
The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b04007
from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/2d30LY8
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