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Friday, June 29, 2018
[ASAP] Two-Dimensional Thickness-Dependent Avalanche Breakdown Phenomena in MoS2 Field-Effect Transistors under High Electric Fields
ACS Nano
DOI: 10.1021/acsnano.8b02925
from ACS Nano: Latest Articles (ACS Publications) https://ift.tt/2KkXhkT
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