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Tuesday, April 14, 2020
[ASAP] Sub-Angstrom Characterization of the Structural Origin for High In-Plane Anisotropy in 2D GeS2
ACS Nano
DOI: 10.1021/acsnano.9b10057
from ACS Nano: Latest Articles (ACS Publications) https://ift.tt/34IjEYj
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