M Song, A Thete, J Berthelot, Q Fu, D Zhang, G Colas des Francs, E Dujardin and A Bouhelier
Plasmonic circuitry is considered as a promising solution-effective technology for miniaturizing and integrating the next generation of optical nano-devices. A key element is the shared metal network between electrical and optical information enabling an efficient hetero-integration of an electronic control layer and a plasmonic data link. Here, we investigate to what extent surface plasmons and current-carrying electrons interfere in such a shared circuitry. By synchronously recording surface plasmon propagation and electrical output characteristics of individual chemically-synthesized silver nanowires we determine the limiting factors hindering the co-propagation of an electrical current and a surface plasmon in these nanoscale circuits.
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Plasmonic circuitry is considered as a promising solution-effective technology for miniaturizing and integrating the next generation of optical nano-devices. A key element is the shared metal network between electrical and optical information enabling an efficient hetero-integration of an electronic control layer and a plasmonic data link. Here, we investigate to what extent surface plasmons and current-carrying electrons interfere in such a shared circuitry. By synchronously recording surface plasmon propagation and electrical output characteristics of individual chemically-synthesized silver nanowires we determine the limiting factors hindering the co-propagation of an electrical current and a surface plasmon in these nanoscale circuits.
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