Friday, July 11, 2014

Identification of Surface Defects and Subsurface Dopants in a Delta-Doped System Using Simultaneous nc-AFM/STM and DFT

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The Journal of Physical Chemistry C

DOI: 10.1021/jp503410j




E. J. Spadafora, J. Berger, P. Mutombo, M. Telychko, M. Švec, Z. Majzik, A. B. McLean and P. Jelínek

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