Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect Transistors

Nano Letters

DOI: 10.1021/nl4010783

Song-Lin Li, Katsunori Wakabayashi, Yong Xu, Shu Nakaharai, Katsuyoshi Komatsu, Wen-Wu Li, Yen-Fu Lin, Alex Aparecido-Ferreira and Kazuhito Tsukagoshi

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