Friday, September 20, 2013

Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy

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The Journal of Physical Chemistry C

DOI: 10.1021/jp407795k




Jingyi Wang, Qingxia Liu and Hongbo Zeng

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