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Friday, September 20, 2013
Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy
The Journal of Physical Chemistry C
DOI: 10.1021/jp407795k
Jingyi Wang, Qingxia Liu and Hongbo Zeng
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