P. T. Araujo, N. M. Barbosa Neto, H. Chacham, S. S. Carara, J. S. Soares, A. D. Souza, L. G. Cançado, A. B. de Oliveira, R. J. C. Batista, E. Joselevich, M. S. Dresselhaus and A. Jorio Link to full article | |||
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Monday, July 02, 2012
In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes
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