Monday, July 02, 2012

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

P. T. Araujo, N. M. Barbosa Neto, H. Chacham, S. S. Carara, J. S. Soares, A. D. Souza, L. G. Cançado, A. B. de Oliveira, R. J. C. Batista, E. Joselevich, M. S. Dresselhaus and A. Jorio



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