Wednesday, February 06, 2013

Off-Stoichiometry Spectroscopic Investigations of Pure Amorphous Silica and N-Doped Silica Thin Films

M. Boffelli, M. Back, E. Cattaruzza, F. Gonella, E. Trave, A. Leto, A. Glisenti and G. Pezzotti



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The Journal of Physical Chemistry C

DOI: 10.1021/jp311697g






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