Friday, March 28, 2014

Statistical Raman Microscopy and Atomic Force Microscopy on Heterogeneous Graphene Obtained after Reduction of Graphene Oxide

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The Journal of Physical Chemistry C

DOI: 10.1021/jp500580g




Siegfried Eigler, Ferdinand Hof, Michael Enzelberger-Heim, Stefan Grimm, Paul Müller and Andreas Hirsch

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