Thursday, April 23, 2015

Closed-Loop ARS Mode for Scanning Ion Conductance Microscopy with Improved Speed and Stability for Live Cell Imaging Applications

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR01577D, Paper
Goo-Eun Jung, hanaul Noh, Yongkyun Shin, Se-Jong Kahng, Ku Youn Baik, Hong-Bae Kim, Sang-Joon Cho, Nam-Joon Cho
Scanning ion conductance microscopy (SICM) is an increasingly useful nanotechnology tool for non-contact, high resolution imaging of live biological specimens such as cellular membranes. In particular, approach-retract-scanning (ARS) mode enables...
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