Nanoscale, 2015, Advance Article
DOI: 10.1039/C4NR07503J, Paper
DOI: 10.1039/C4NR07503J, Paper
W. Hourani, P. Periwal, F. Bassani, T. Baron, G. Patriarche, E. Martinez
Scanning Auger microscopy is used to determine the axial and radial chemical compositions of heterostructured Si1-xGex nanowires at the nanoscale.
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Scanning Auger microscopy is used to determine the axial and radial chemical compositions of heterostructured Si1-xGex nanowires at the nanoscale.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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