Friday, July 01, 2016

Nature of Cu Interstitials in Al2O3 and the Implications for Filament Formation in Conductive Bridge Random Access Memory Devices

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The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b02728


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/29ymxhQ
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