Monday, August 01, 2016

Thickness Dependence of Carrier Mobility and the Interface Trap Free Energy Investigated by Impedance Spectroscopy in Organic Semiconductors

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b03964


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/2anpWRq
via IFTTT
Posted by at

No comments:

Post a Comment

Subscribe to: Post Comments (Atom)