Thursday, September 15, 2016

Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b04007


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/2d30LY8
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