Tuesday, March 07, 2017

Probing the Interfacial Chemistry of Ultrathin ALD-Grown TiO2 Films: An In-Line XPS Study

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.6b09468


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/2mDlSEK
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