Nanochemistry: Estimation of the Charge Injection Barrier at a Metal/Organic Semiconductor Interface Based on Accumulated Charge Measurement: The Effect of Offset Bias Voltages

Thursday, June 29, 2017

Estimation of the Charge Injection Barrier at a Metal/Organic Semiconductor Interface Based on Accumulated Charge Measurement: The Effect of Offset Bias Voltages

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The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.7b04456

from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) http://ift.tt/2tp8ibA
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