Tuesday, January 30, 2018

Flaw-Containing Alumina Hollow Nanostructures Have Ultrahigh Fracture Strength To Be Incorporated into High-Efficiency GaN Light-Emitting Diodes

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Nano Letters
DOI: 10.1021/acs.nanolett.7b05009


from Nano Letters: Latest Articles (ACS Publications) http://ift.tt/2BEXYMB
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