Tuesday, March 19, 2019

[ASAP] Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography

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The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.8b08620


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) https://ift.tt/2Ogcouv
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