Friday, October 16, 2020

[ASAP] Identifying Native Point Defects in the Topological Insulator Bi2Te3

TOC Graphic

ACS Nano
DOI: 10.1021/acsnano.0c04861


from ACS Nano: Latest Articles (ACS Publications) https://ift.tt/31v9aeH
via IFTTT
Posted by at

No comments:

Post a Comment

Subscribe to: Post Comments (Atom)