Monday, January 04, 2021

[ASAP] Evolution of the Electronic Properties of ZrX2 (X = S, Se, or Te) Thin Films under Varying Thickness

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.0c10085


from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) https://ift.tt/3rPe0ip
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