[ASAP] Temperature-Dependent Electronic Structure of TiO2 Thin Film Deposited by the Radio Frequency Reactive Magnetron Sputtering Technique: X ray Absorption Near-Edge Structure and X ray Photoelectron Spectroscopy
The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.2c02311
from The Journal of Physical Chemistry C: Latest Articles (ACS Publications) https://ift.tt/41EDMxB
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