Friday, January 02, 2015

Defect Scaling with Contact Area in EGaIn-Based Junctions: Impact on Quality, Joule Heating, and Apparent Injection Current

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The Journal of Physical Chemistry C

DOI: 10.1021/jp511002b




Li Jiang, C. S. Suchand Sangeeth, Albert Wan, Ayelet Vilan and Christian A. Nijhuis

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