Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy

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Masanao Ito, Kei Kobayashi, and Yuji Miyato et al.

The local potential measurement of an operating carbon nanotube transistor provides information on the defects in the nanotube and the interfacial potential barriers. While Kelvin-probe force microscopy is a powerful technique to measure the local surface potential, its accuracy is often degraded ... [Appl. Phys. Lett. 102, 013115 (2013)] published Thu Jan 10, 2013.



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