Thursday, January 17, 2013

Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy

(author unknown)



R. J. Cobley, R. A. Brown, and C. J. Barnett et al.

A quantitative method to measure the reduction in oxide species on the surface of electrochemically etched tungsten tips during direct current annealing is developed using energy dispersive x-ray spectroscopy. Oxide species are found to decrease with annealing current, with the trend repeatable ov ... [Appl. Phys. Lett. 102, 023111 (2013)] published Thu Jan 17, 2013.



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