Tuesday, November 05, 2013

Nanoscale mechanics by tomographic contact resonance atomic force microscopy

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR04981G, Paper

Gheorghe Stan, Santiago Solares, Bede Pittenger, Natalia Erina, Chanmin Su

We report on quantifiable depth-dependent contact resonance AFM (CR-AFM) measurements over polystyrene-polypropylene (PS-PP) blends to detail surface and sub-surface features in terms of elastic modulus and mechanical dissipation. The depth-dependences...

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