Tunneling Electroresistance Induced by Interfacial Phase Transitions in Ultrathin Oxide Heterostructures

Nano Letters

DOI: 10.1021/nl4025598

Lu Jiang, Woo Seok Choi, Hyoungjeen Jeen, Shuai Dong, Yunseok Kim, Myung-Geun Han, Yimei Zhu, Sergei V. Kalinin, Elbio Dagotto, Takeshi Egami and Ho Nyung Lee

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