Wednesday, March 26, 2014

Multi-Level Control of Conductive Nano-Filament Evolution in HfO2 ReRAM by Pulse-Train Operations

Nanoscale , 2014, Accepted Manuscript

DOI: 10.1039/C4NR00500G, Communication

Liang Zhao, Hong-Yu Chen, Shih-Chieh Wu, Zizhen Jiang, Shimeng Yu, Tuo-Hung Hou, H.-S. Philip Wong, Yoshio Nishi

Precise electrical manipulation of nanoscale defects such as vacancy nano-filament is highly desired for the multi-level control of ReRAM. In this paper we present a systematic investigation on the pulse-train...

The content of this RSS Feed (c) The Royal Society of Chemistry





Click for full article

No comments:

Post a Comment