Monday, March 24, 2014

Three-Dimensional Location of a Single Dopant with Atomic Precision by Aberration-Corrected Scanning Transmission Electron Microscopy

TOC Graphic


Nano Letters

DOI: 10.1021/nl500564b




Ryo Ishikawa, Andrew R. Lupini, Scott D. Findlay, Takashi Taniguchi and Stephen J. Pennycook

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