Tuesday, March 04, 2014

Warping effect-induced optical absorbance increment of topological insulator films for THz photodetectors with high signal-to-noise ratio




Nanoscale , 2014, Advance Article

DOI: 10.1039/C3NR06506E, Communication

J. M. Shao, H. Li, G. W. Yang

The absorbance of topological insulator films deviates from [small alpha][small pi]/2 (black line) and increases monotonously with the photon energy when the hexagonal warping term is [small lambda] [not equal] 0.

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