Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR05512A, Communication
DOI: 10.1039/C5NR05512A, Communication
Faruk Dirisaglik, Gokhan Bakan, Zoila Jurado, Sadid Muneer, Mustafa Akbulut, Jonathan Rarey, Lindsay Sullivan, Maren Wennberg, Adrienne King, Lingyi Zhang, Rebecca Nowak, Chung Lam, Helena Silva, Ali Gokirmak
A high-speed, device-level characterization technique is developed to capture metastable electrical properties, crystallization and resistance drift behaviour.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
A high-speed, device-level characterization technique is developed to capture metastable electrical properties, crystallization and resistance drift behaviour.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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