Friday, June 28, 2013

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

TOC Graphic


Nano Letters

DOI: 10.1021/nl401129m




Julia Tisler, Thomas Oeckinghaus, Rainer J. Stöhr, Roman Kolesov, Rolf Reuter, Friedemann Reinhard and Jörg Wrachtrup

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