Nanoscale , 2013, Advance Article
DOI: 10.1039/C3NR02929H, Paper
DOI: 10.1039/C3NR02929H, Paper
Jose Luis Cuellar, Irantzu Llarena, Jagoba J. Iturri, Edwin Donath, Sergio Enrique Moya
The thickness of a poly(sulfo propyl methacrylate) (PSPM) brush is determined by Atomic Force Microscopy (AFM) imaging as a function of the loading force at different ionic strengths, ranging from Milli-Q water to 1 M NaCl.
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The thickness of a poly(sulfo propyl methacrylate) (PSPM) brush is determined by Atomic Force Microscopy (AFM) imaging as a function of the loading force at different ionic strengths, ranging from Milli-Q water to 1 M NaCl.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
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