Monday, October 14, 2013

Quantitative In Situ TEM Tensile Fatigue Testing of Nanocrystalline Metallic Ultrathin Films

Nanoscale , 2013, Accepted Manuscript

DOI: 10.1039/C3NR04035F, Paper

Ehsan Hosseinian, Olivier Pierron

A unique technique to perform quantitative in situ transmission electron microscopy (TEM) fatigue testing on ultrathin films and nanomaterials is demonstrated. The technique relies on a microelectromechanical system (MEMS) device...

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