In Situ Characterizations of Nanostructured SnOx/Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM)
The Journal of Physical Chemistry C
DOI: 10.1021/jp409272j
Stephanus Axnanda, Zhongwei Zhu, Weiping Zhou, Baohua Mao, Rui Chang, Sana Rani, Ethan Crumlin, Gabor Somorjai and Zhi Liu
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