Wednesday, January 22, 2014

In Situ Characterizations of Nanostructured SnOx/Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM)

TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp409272j




Stephanus Axnanda, Zhongwei Zhu, Weiping Zhou, Baohua Mao, Rui Chang, Sana Rani, Ethan Crumlin, Gabor Somorjai and Zhi Liu

Click for full article

No comments:

Post a Comment