Friday, January 17, 2014

Nondestructive Monitoring of Defect Evolution in Epitaxial CdTe Thin Layers Grown on Si(111)

TOC Graphic


The Journal of Physical Chemistry C

DOI: 10.1021/jp409538p




J. M. Oliveira, A. Malachias, C. A. Ospina and S. O. Ferreira

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