Retrieving the optoelectronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS

Nanoscale , 2014, Accepted Manuscript

DOI: 10.1039/C4NR03691C, Paper

Alberto Eljarrat, Lluis Lopez-Conesa, Julian Lopez-Vidrier, Sergi Hernandez, Blas Garrido, Cesar Magen, Francesca Peiro, Sonia Estrade

In this work we apply low-loss electron energy loss spectroscopy (EELS) to probe structural and electronic properties of single silicon nanocrystals (NCs) embedded in three different dielectric matrices (SiO₂ , SiC...

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