Wednesday, January 07, 2015

Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Spectroscopy

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ACS Nano

DOI: 10.1021/nn506753u




Qian Li, Stephen Jesse, Alexander Tselev, Liam Collins, Pu Yu, Ivan Kravchenko, Sergei V. Kalinin and Nina Balke

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