Thursday, June 25, 2015

Characterization of the structural defects in CVD-grown monolayered MoS2 using near-field photoluminescence imaging

Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR02897C, Communication
Yongjun Lee, Seki Park, Hyun Kim, Gang Hee Han, Young Hee Lee, Jeongyong Kim
Near-field photoluminescence imaging provides nanoscale optical identifications visualizing grain boundaries and nanosized adlayer defects of CVD-grown monolayered MoS2.
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