Thursday, August 27, 2015

Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy

Nanoscale, 2015, 7,14715-14722
DOI: 10.1039/C5NR04264J, Paper
Enrico Brinciotti, Georg Gramse, Soeren Hommel, Thomas Schweinboeck, Andreas Altes, Matthias A. Fenner, Juergen Smoliner, Manuel Kasper, Giorgio Badino, Silviu-Sorin Tuca, Ferry Kienberger
A new method to probe the resistivity and dopant concentration of semiconductors with nanoscale resolution using SMM is presented.
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